Skip to content

Model for dielectric_function_JVASP_1002_Si

  • Description: This is a benchmark to evaluate how accurately an ES model can predict the dielectric function (spectra) for Si (JVASP-1002) experimental results are used as a ground truth for comparison and the multi-mean absolute error (multi-MAE) with respect to the experimental value is used as an accuracy metric


Model benchmarks

Model name Dataset MAE Team name Dataset size Date submitted Notes
vasp_optb88vdw_linoptdft_3d4.341184324490689JARVIS101-14-2023CSV, JSON,, Info, JVASP-1002
vasp_tbmbjdft_3d3.3922169684774715JARVIS101-14-2023CSV, JSON,, Info, JVASP-1002