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Model for epsx_JVASP_2376_ZnSiP2

  • Description: This is a benchmark to evaluate how accurately an ES model can predict the static dielectric constant (x direction) for ZnSiP2 (JVASP-2376), experimental results are used as a ground truth for comparison and the mean absolute error (MAE) with respect to the experimental value is used as an accuracy metric


Model benchmarks

Model name Dataset MAE Team name Dataset size Date submitted Notes
vasp_optb88vdw_linoptdft_3d0.1707JARVIS101-14-2023CSV, JSON,, Info, JVASP-2376
vasp_optb88vdw_dfptdft_3d1.2953JARVIS101-14-2023CSV, JSON,, Info, JVASP-2376