Mobile Threat Catalogue

Focused Ion Beams


Threat Category: USIM / SIM / UICC security

ID: STA-35

Threat Description: Focused Ion beam (FIB) it shoots ions that can make changes with the circuitry. Blown fuses of test circuits can be reconnected, or hidden internal signals can be forwarded to external wires.

Threat Origin

A Review of Smartcard Security Issues 1

Exploit Examples

Not Applicable

CVE Examples

Not Applicable

Possible Countermeasures


  1. H. Ko and R. Caytiles, “A Review of Smartcard Security Issues,” Journal of Security Engineering, 8, no. 3 (2011): 6. [accessed 10/11/21]