Threat Category: USIM / SIM / UICC security
ID: STA-35
Threat Description: Focused Ion beam (FIB) it shoots ions that can make changes with the circuitry. Blown fuses of test circuits can be reconnected, or hidden internal signals can be forwarded to external wires.
Threat Origin
A Review of Smartcard Security Issues 1
Exploit Examples
Not Applicable
CVE Examples
Not Applicable
Possible Countermeasures
References
H. Ko and R. Caytiles, “A Review of Smartcard Security Issues,” Journal of Security Engineering, 8, no. 3 (2011): 6. https://docplayer.net/23347975-A-review-of-smartcard-security-issues.html [accessed 10/11/21] ↩