Threat Category: USIM / SIM / UICC security
ID: STA-33
Threat Description: Microscopes optical and Scanning Electron Microscopes (SEM) can be used for optical analysis and reverse engineering. A chip that is still capable of performing its electronic functions can be analyzed to reveal active sections in the chip and potentially even running code or passing data values.
Threat Origin
A Review of Smartcard Security Issues 1
Exploit Examples
Not Applicable
CVE Examples
Not Applicable
Possible Countermeasures
References
H. Ko and R. Caytiles, “A Review of Smartcard Security Issues,” Journal of Security Engineering, 8, no. 3 (2011): 6. https://docplayer.net/23347975-A-review-of-smartcard-security-issues.html [accessed 10/11/21] ↩