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         SCATMECH > Classes and Functions >
        Surface Scattering Models
        > Correlated_Roughness_Stack_BRDF_Model 
	class
        Correlated_Roughness_Stack_BRDF_Model
        
         
        The class
        Correlated_Roughness_Stack_BRDF_Model uses
        Roughness_Stack_BRDF_Model to calculate the scatter from roughness of a stack of films
        when all of the interfaces have identical roughness
        functions.
  
         
           
          
	   Parameters:
        
          
            | Parameter | 
            Data
            Type | 
            Description | 
            Default | 
           
          
            | lambda | 
            double | 
            Wavelength of the light
            in vacuum [µm]. 
            (Inherited from BRDF_Model). | 
            0.532 | 
           
          
            | type | 
            int | 
            
	      Indicates whether the light is incident from above the
            substrate or from within the substrate and whether the
            scattering is evaluated in reflection or transmission.
            The choices are: 
	      0 : Light is incident from the above the substrate, and scattering is evaluated in reflection. 
	      1 : Light is incident from the above the substrate, and scattering is evaluated in transmission. 
	      2 : Light is incident from the within the substrate, and scattering is evaluated in reflection. 
	      3 : Light is incident from the within the substrate, and scattering is evaluated in transmission. 
	      For 1, 2, and 3, the substrate must be non-absorbing. 
            (Inherited from BRDF_Model). | 
            0 | 
           
          
            | substrate | 
            dielectric_function | 
            The
            optical constants of the substrate, expressed as a
            complex number (n,k) or, optionally, as a function of
            wavelength. 
            (Inherited from BRDF_Model). | 
            (4.05,0.05) | 
           
          
            | psd | 
            PSD_Function_Ptr | 
            The
            two-dimensional power spectrum of the surface height
            function [µm4]. 
            (Inherited from Roughness_BRDF_Model). | 
            ABC_PSD_Function | 
           
          
            | stack | 
            StackModel_Ptr | 
            Description of the stack
            of films deposited on the substrate.
	     | 
            No_StackModel | 
           
         
        See also:
        SCATMECH Home,   Conventions,   BRDF_Model,   Roughness_BRDF_Model,   Roughness_Stack_BRDF_Model,  
        StackModel 
        J. M. Elson, "Multilayer-coated optics: guided-wave
        coupling and scattering by means of interface random
        roughness," J. Opt. Soc. Am. A 12(4), 729
        (1995). 
	J. M. Elson, "Theory and Software for Light Scattering From Multilayer Optical
	Components with Interfacial Roughness," Naval Air Warfare Center Weapons Division (NAWCWPNS) 
	Technical Publication 8084 (1992). 
	Include file:
          
#include "allrough.h"
 
        Source code:
          
allrough.cpp
 
        Definition of public elements:
          
class Correlated_Roughness_Stack_BRDF_Model
 : public Roughness_BRDF_Model
{
};
 
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