class Roughness_Stack_BRDF_Model
The class Roughness_Stack_BRDF_Model implements the solution to first-order vector perturbation theory for roughness in the smooth surface limit of a single interface of a dielectric stack as described by Elson. It inherits the properties of Roughness_BRDF_Model.
Parameters:
| Parameter | Data Type | Description | Default |
|---|---|---|---|
| lambda | double | Wavelength of the light
in vacuum [µm]. (Inherited from BRDF_Model). |
0.532 |
| type | int |
Indicates whether the light is incident from above the
substrate or from within the substrate and whether the
scattering is evaluated in reflection or transmission.
The choices are: 0 : Light is incident from the above the substrate, and scattering is evaluated in reflection. 1 : Light is incident from the above the substrate, and scattering is evaluated in transmission. 2 : Light is incident from the within the substrate, and scattering is evaluated in reflection. 3 : Light is incident from the within the substrate, and scattering is evaluated in transmission. For 1, 2, and 3, the substrate must be non-absorbing. (Inherited from BRDF_Model). |
0 |
| substrate | dielectric_function | The
optical constants of the substrate, expressed as a
complex number (n,k) or, optionally, as a function of
wavelength. (Inherited from BRDF_Model). |
(4.05,0.05) |
| psd | PSD_Function_Ptr | The
two-dimensional power spectrum of the surface height
function [µm4]. (Inherited from Roughness_BRDF_Model). |
ABC_PSD_Function |
| stack | StackModel_Ptr | Description of the stack of films deposited on the substrate. | No_StackModel |
| this_layer | int | Index of the rough interface, where (0) is the most buried interface, (1) is the next most buried interface, etc. This model assumes that none of the other interfaces is rough. | 0 |
See also:
SCATMECH Home, Conventions, BRDF_Model, Roughness_BRDF_Model, dielectric_stack
J. M. Elson, "Multilayer-coated optics: guided-wave
coupling and scattering by means of interface random
roughness," J. Opt. Soc. Am. A 12(4), 729
(1995).
J. M. Elson, "Theory and Software for Light Scattering From Multilayer Optical
Components with Interfacial Roughness," Naval Air Warfare Center Weapons Division (NAWCWPNS)
Technical Publication 8084 (1992).
Include file:
#include "roughnes.h"
Source code:
roughnes.cpp
Definition of public elements:
class Roughness_Stack_BRDF_Model : public Roughness_BRDF_Model { };
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Current SCATMECH version: 7.22 (April 2021)