SCATMECH > Classes and Functions > Surface Scattering Models > Rayleigh_Stack_BRDF_Model

class Rayleigh_Stack_BRDF_Model

The class Rayleigh_Stack_BRDF_Model implements the Rayleigh approximation for scattering by a small sphere located anywhere in a multilayer stack. The sphere may be above, embedded within, or below the stack.

Diagram showing a film stack with a spherical defect embedded in it at a specific depth.

Parameters:

Parameter Data Type Description Default
lambda double Wavelength of the light in vacuum [µm].
(Inherited from BRDF_Model.)		 0.532
type int Indicates whether the light is incident from above the substrate or from within the substrate and whether the scattering is evaluated in reflection or transmission. The choices are:
0 : Light is incident from the above the substrate, and scattering is evaluated in reflection.
1 : Light is incident from the above the substrate, and scattering is evaluated in transmission.
2 : Light is incident from the within the substrate, and scattering is evaluated in reflection.
3 : Light is incident from the within the substrate, and scattering is evaluated in transmission.
For 1, 2, and 3, the substrate must be non-absorbing.
(Inherited from BRDF_Model).		 0
substrate dielectric_function The optical constants of the substrate, expressed as a complex number (n,k) or, optionally, as a function of wavelength.
(Inherited from BRDF_Model.)		 (4.05,0.05)
density double The surface number density of local scatterers [µm-2].
(Inherited from Local_BRDF_Model.)		 1
stack StackModel_Ptr Description of any stack of films deposited on the substrate. No_StackModel
radius double The radius of the spherical defect [µm]. 0.01
sphere dielectric_function The optical constants of the spherical defect or particle, expressed as a complex number (n,k) or, optionally, as a function of wavelength. (1,0)
depth double The depth of the center of the sphere with respect to the outermost interface [µm]. This value can be negative, which indicates that the sphere is located above the dielectric stack. The value can also be greater than the total thickness of the stack, which indicates that the sphere is located below the stack. 0

See also:

SCATMECH Home,   Conventions,   BRDF_Model

T.A. Germer, "Polarized light scattering by microroughness and small defects in dielectric layers," J. Opt. Soc. Am. A 18(6), 1279-1288 (2001).
T.A. Germer, "Application of bidirectional ellipsometry to the characterization of roughness and defects in dielectric layers," Proc. SPIE 3275, 121–131 (1998).

Include file:

#include "raystack.h"

Source code:

raystack.cpp

Definition of public elements:

class Rayleigh_Stack_BRDF_Model
    : public Local_BRDF_Model
{
};

For More Information

SCATMECH Technical Information and Questions
Sensor Science Division Home Page
Sensor Science Division Inquiries
Website Comments

Current SCATMECH version: 7.22 (April 2021)