class Microroughness_BRDF_Model
The class Microroughness_BRDF_Model implements the solution to first-order vector perturbation, or Rayleigh-Rice, theory for roughness in the smooth surface limit for a single interface with no films. It inherits the properties of Roughness_BRDF_Model, which supplies the model with the power spectral density (PSD) function of the surface roughness.
Parameters:
| Parameter | Data Type | Description | Default |
|---|---|---|---|
| lambda | double | Wavelength of the light
in vacuum [µm]. (Inherited from BRDF_Model). |
0.532 |
| type | int |
Indicates whether the light is incident from above the
substrate or from within the substrate and whether the
scattering is evaluated in reflection or transmission.
The choices are: 0 : Light is incident from the above the substrate, and scattering is evaluated in reflection. 1 : Light is incident from the above the substrate, and scattering is evaluated in transmission. 2 : Light is incident from the within the substrate, and scattering is evaluated in reflection. 3 : Light is incident from the within the substrate, and scattering is evaluated in transmission. For 1, 2, and 3, the substrate must be non-absorbing. (Inherited from BRDF_Model). |
0 |
| substrate | dielectric_function | The
optical constants of the substrate, expressed as a
complex number (n,k) or, optionally, as a function of
wavelength. (Inherited from BRDF_Model). |
(4.05,0.05) |
| psd | PSD_Function_Ptr | The
two-dimensional power spectrum of the surface height
function [µm4]. (Inherited from Roughness_BRDF_Model). |
ABC_PSD_Function |
See also:
SCATMECH Home, Conventions, BRDF_Model, Roughness_BRDF_Model
D. E. Barrick, Radar Cross Section Handbook, (Plenum, New York, 1970).
J. C. Stover, Optical Scattering: Measurement and Analysis, (SPIE Optical Engineering Press, Bellingham, WA, 1995).
S. O. Rice, "Reflection of electromagnetic waves from slightly rough surfaces," Commun.Pure Appl. Math. 4, 351 (1951).
E. L. Church and J. M. Zavada, "Residual surface roughness of diamond-turned optics," Appl. Opt. 14, 1788 (1975).
E. L. Church, H. A., Jenkinson, and J. M. Zavada, "Measurement of the finish of diamond-turned metal surfaces by differential light scattering," Opt. Eng. 16, 360 (1977).
E. L. Church, H. A., Jenkinson, and J. M. Zavada, "Relationship between surface scattering and microtopographic features," Opt. Eng. 18, 125 (1979).
Include file:
#include "urough.h"
Source code:
urough.cpp
Definition of public elements:
class Microroughness_BRDF_Model : public Roughness_BRDF_Model { };
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Current SCATMECH version: 7.22 (April 2021)