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Surface Scattering Models
> Finite_Aperture_Instrument_BRDF_Model
class Finite_Aperture_Instrument_BRDF_Model
The class Finite_Aperture_Instrument_BRDF_Model
calculates the light scattering averaged over a solid angle
given by a circular detector with uniform sensitivity. It
accepts as a parameter another BRDF_Model and a half angle for the
detector.
Integration is performed
over a circular aperture using a multi-point
integration scheme based upon Gauss-Zernike integration.
Parameters:
Parameter |
Data Type |
Description |
Default |
lambda |
double |
Wavelength of the light in vacuum [µm].
(Inherited from BRDF_Model.) |
0.532 |
type |
int |
Indicates whether the light is incident from above the
substrate or from within the substrate and whether the
scattering is evaluated in reflection or transmission.
The choices are:
0 : Light is incident from the above the substrate, and scattering is evaluated in reflection.
1 : Light is incident from the above the substrate, and scattering is evaluated in transmission.
2 : Light is incident from the within the substrate, and scattering is evaluated in reflection.
3 : Light is incident from the within the substrate, and scattering is evaluated in transmission.
For 1, 2, and 3, the substrate must be non-absorbing.
Finite_Aperture_Instrument_BRDF_Model supports all modes supported by parameter model.
(Inherited from BRDF_Model). |
0 |
substrate |
dielectric_function |
The
optical constants of the substrate, expressed as a
complex number (n,k) or, optionally, as a function of
wavelength.
(Inherited from BRDF_Model.) |
(4.05,0.05) |
alpha |
double |
The half
angle of the circular aperture over which
the scattering is averaged [deg]. |
0 |
integralmode |
int |
The integration order, ranging from 1 to 7. The
number of points in the integration depends upon this order and are
1, 4, 7, 16, 21, 36, and 43 for orders 1, 2, 3, 4, 5, 6, and 7, respectively.
|
3 |
model |
BRDF_Model_Ptr |
The light
scattering model.
Note: The parameters lambda, type, and substrate must match those of model. |
Microroughness_BRDF_Model |
See also:
SCATMECH Home, Conventions, Instrument_BRDF_Model, dielectric_stack
NIST Digital Library of Mathematical Functions, Section 3.5(x), Numerical Methods, Quadrature, Cubature Formulas.
T.A. Germer and H.J. Patrick, "Effect of bandwidth
and numerical aperture in optical scatterometry," Proc. SPIE 7638, 76381-F
(2010).
Include file:
#include "finiteaperture.h"
Source code:
finiteaperture.cpp
Definition of public elements:
class Finite_Aperture_Instrument_BRDF_Model
: public Instrument_BRDF_Model
{
};
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Current SCATMECH version: 7.22 (April 2021)
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