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         SCATMECH > Classes and Functions >
        Surface Scattering Models
        > Finite_Aperture_Instrument_BRDF_Model 
	class Finite_Aperture_Instrument_BRDF_Model
        
         
	
        The class Finite_Aperture_Instrument_BRDF_Model
        calculates the light scattering averaged over a solid angle
        given by a circular detector with uniform sensitivity. It
        accepts as a parameter another BRDF_Model and a half angle for the
        detector.
	    Integration is performed
            over a circular aperture using a multi-point
            integration scheme based upon Gauss-Zernike integration.
	
  
         
           
          
	  Parameters:
        
          
            | Parameter | 
            Data Type | 
            Description | 
            Default | 
           
          
            | lambda | 
            double | 
            Wavelength of the light in vacuum [µm]. 
            (Inherited from BRDF_Model.) | 
            0.532 | 
           
          
            | type | 
            int | 
            
	      Indicates whether the light is incident from above the
            substrate or from within the substrate and whether the
            scattering is evaluated in reflection or transmission.
            The choices are: 
	      0 : Light is incident from the above the substrate, and scattering is evaluated in reflection. 
	      1 : Light is incident from the above the substrate, and scattering is evaluated in transmission. 
	      2 : Light is incident from the within the substrate, and scattering is evaluated in reflection. 
	      3 : Light is incident from the within the substrate, and scattering is evaluated in transmission. 
	      For 1, 2, and 3, the substrate must be non-absorbing. 
	      Finite_Aperture_Instrument_BRDF_Model supports all modes supported by parameter model. 
            (Inherited from BRDF_Model). | 
            0 | 
           
          
            | substrate | 
            dielectric_function | 
            The
            optical constants of the substrate, expressed as a
            complex number (n,k) or, optionally, as a function of
            wavelength. 
            (Inherited from BRDF_Model.) | 
            (4.05,0.05) | 
           
          
            | alpha | 
            double | 
            The half
            angle of the circular aperture over which
            the scattering is averaged [deg]. | 
            0 | 
           
          
            | integralmode | 
            int | 
            The integration order, ranging from 1 to 7.  The 
		number of points in the integration depends upon this order and are
		1, 4, 7, 16, 21, 36, and 43 for orders 1, 2, 3, 4, 5, 6, and 7, respectively.
	       | 
            3 | 
           
          
            | model | 
            BRDF_Model_Ptr | 
            The light
            scattering model. 
            Note: The parameters lambda, type, and substrate must match those of model. | 
            Microroughness_BRDF_Model | 
           
         
        See also:
        SCATMECH Home,   Conventions,   Instrument_BRDF_Model,   dielectric_stack 
            NIST Digital Library of Mathematical Functions, Section 3.5(x), Numerical Methods, Quadrature, Cubature Formulas.
	   T.A. Germer and H.J. Patrick, "Effect of bandwidth
	  and numerical aperture in optical scatterometry," Proc. SPIE 7638, 76381-F
	  (2010).
	 Include file:
          
#include "finiteaperture.h"
 
        Source code:
          
finiteaperture.cpp
 
        Definition of public elements:
          
class Finite_Aperture_Instrument_BRDF_Model
  : public Instrument_BRDF_Model
{
};
 
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Current SCATMECH version: 7.22 (April 2021) 
 
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