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                            SCATMECH > Classes and Functions >
                            Surface Scattering Models
                            > Correlated_Roughness_BRDF_Model
                         
                        class Correlated_Roughness_BRDF_Model
                         
                        
                            The class Correlated_Roughness_BRDF_Model
                            implements the solution to first-order vector perturbation,
                            or Rayleigh-Rice, theory for conformal roughness of a
                            dielectric film in the smooth surface limit. It inherits
                            the properties of Roughness_BRDF_Model, which inherits
                            the properties of BRDF_Model.
                         
                             
                                 
                            
                            Parameters:
                            
                                
                                    | Parameter | 
                                    
                                        Data
                                        Type
                                     | 
                                    Description | 
                                    Default | 
                                 
                                
                                    | lambda | 
                                    double | 
                                    
                                        Wavelength of the light
                                        in vacuum [µm]. 
                                        (Inherited from BRDF_Model).
                                     | 
                                    0.532 | 
                                 
                                
                                    | type | 
                                    int | 
                                    
                                        Indicates whether the light is incident from above the
                                        substrate or from within the substrate and whether the
                                        scattering is evaluated in reflection or transmission.
                                        The choices are: 
                                        0 : Light is incident from the above the substrate, and scattering is evaluated in reflection. 
                                        1 : Light is incident from the above the substrate, and scattering is evaluated in transmission. 
                                        2 : Light is incident from the within the substrate, and scattering is evaluated in reflection. 
                                        3 : Light is incident from the within the substrate, and scattering is evaluated in transmission. 
                                        (Inherited from BRDF_Model).
                                     | 
                                    0 | 
                                 
                                
                                    | substrate | 
                                    dielectric_function | 
                                    
                                        The
                                        optical constants of the substrate, expressed as a
                                        complex number (n,k) or, optionally, as a function of
                                        wavelength. 
                                        (Inherited from BRDF_Model).
                                     | 
                                    (4.05,0.05) | 
                                 
                                
                                    | psd | 
                                    PSD_Function_Ptr | 
                                    
                                        The
                                        two-dimensional power spectrum of the surface height
                                        function [µm4]. 
                                        (Inherited from Roughness_BRDF_Model).
                                     | 
                                    ABC_PSD_Function | 
                                 
                                
                                    | film | 
                                    dielectric_function | 
                                    
                                        The
                                        optical constants of the film, expressed as a complex
                                        number (n,k) or, optionally, as a function of
                                        wavelength.
                                     | 
                                    (1.46,0.05) | 
                                 
                                
                                    | thickness | 
                                    double | 
                                    
                                        The
                                        thickness of the film [µm].
                                     | 
                                    0.05 | 
                                 
                             
                            See also:
                        
                            SCATMECH Home,   Conventions,   BRDF_Model,   Roughness_BRDF_Model
                         
                        
                            
                                J. M. Elson, "Light scattering from surfaces with a
                                single dielectric overlayer," J. Opt. Soc. Am. 66
                                (7) 682-694 (1976).
                            
                         
                        Include file:
                        
#include "crough.h"
 
                        Source code:
                        
crough.cpp
 
                        Definition of public elements:
                        
class Correlated_Roughness_BRDF_Model
 : public Roughness_BRDF_Model
{
    public:
                        Correlated_Roughness_BRDF_Model( int ask=0);
        void set_thickness( double t);
        double get_thickness();
        void set_film(const dielectric_function& e);
                        dielectric_function get_film();
        virtual void AskUser();
        virtual void set_parameter(const string& name,const string& value);
        static Inheritance inheritance;
        virtual Model* clone() const;
};
                         
                         
                        
                            
                                Functions to
                                set and get the thickness of the film.
                          
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                                Functions to set and get the dielectric function of the
                                layer.
                          
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                                The constructor for
                                Correlated_Roughness_BRDF_Model. If
                                ask=1, then the program asks the user
                                for the layer thickness and optical constant.
                          
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                            Current SCATMECH version: 7.22 (April 2021) 
                             
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