TY  - RPRT
TI  - Detailed Study of Uncertainties in On-Wafer Transistor Noise-Parameter Measurements 
AU  - Randa, James P.
PY  - 2016
PB  - National Institute of Standards and Technology
SN  - NIST TN 1939
DO  - 10.6028/NIST.TN.1939
ER  -