TY  - RPRT
TI  - Development of a testing methodology to predict optical disk life expectancy values 
AU  - Podio, Fernando L
PY  - 1991
PB  - National Institute of Standards and Technology
CY  - Gaithersburg, MD
SN  - NIST SP 500-200
DO  - 10.6028/NIST.SP.500-200
ER  -