TY  - RPRT
TI  - Evaluating a chip, wafer, or lot using SUXES, SPICE, and STAT2 
AU  - Marshall, J C
AU  - Mattis, R L
PY  - 1992
PB  - National Institute of Standards and Technology
CY  - Gaithersburg, MD
SN  - NIST SP 400-90
DO  - 10.6028/NIST.SP.400-90
ER  -