TY  - RPRT
TI  - A workshop report on "electron microscopy frontiers: challenges and opportunities" 
AU  - Bonevich, John
AU  - Chiaramonti Debay, Ann
AU  - Herzing, Andrew
AU  - Keller, Bob
AU  - Lau, June
PY  - 2017
PB  - National Institute of Standards and Technology
CY  - Gaithersburg, MD
SN  - NIST SP 1217
DO  - 10.6028/NIST.SP.1217
ER  -