TY  - RPRT
TI  - Stability of iridium oxide films in high temperatures, 200-250 [degrees] C, solutions 
AU  - Kreider, Kenneth
AU  - Tarlov, Michael
PY  - 1989
PB  - National Institute of Standards and Technology
CY  - Gaithersburg, MD
SN  - NIST IR 90-4227
DO  - 10.6028/NIST.IR.90-4227
ER  -