TY  - RPRT
TI  - Bitemark analysis: a NIST scientific foundation review
AU  - Sauerwein, Kelly
AU  - Butler, John M
AU  - Reczek, Karen K
AU  - Reed, Christina
PY  - 2023
PB  - National Institute of Standards and Technology (U.S.)
CY  - Gaithersburg, MD
SN  - NIST IR 8352
DO  - 10.6028/NIST.IR.8352
ER  -