TY  - RPRT
TI  - Nail to nail fingerprint challenge: enrollment set size variability
AU  - Fiumara, Gregory
AU  - Ko, Kenneth
AU  - Tabassi, Elham
AU  - Flanagan, Patricia
AU  - Grantham, John
AU  - Marshall, Karen
AU  - Schwarz, Matthew
AU  - Woodgate, Bryan
AU  - Boehnen, Christopher
PY  - 2019
PB  - National Institute of Standards and Technology
CY  - Gaithersburg, MD
SN  - NIST IR 8257
DO  - 10.6028/NIST.IR.8257
ER  -