TY - RPRT TI - Sensitivity Analysis for Biometric Systems: A Methodology Based on Orthogonal Experiment Designs AU - Lee, Y. AU - Filliben, J.J AU - Michaels, R.J. AU - Phillips, P.J. PY - 2012 PB - National Institute of Standards and Technology SN - NIST IR 7855 DO - 10.6028/NIST.IR.7855 ER -