TY  - RPRT
TI  - Comparison of confidence intervals for large operational biometric data by parametric and non-parametric methods 
AU  - Cheng, Su Lan
AU  - Micheals, Ross J
AU  - Lu, Z Q John
PY  - 2010
PB  - National Institute of Standards and Technology
CY  - Gaithersburg, MD
SN  - NIST IR 7740
DO  - 10.6028/NIST.IR.7740
ER  -