TY  - RPRT
TI  - Symbols representing biometrics in use 
AU  - Choong, Yee-Yin
AU  - Theofanos, Mary
AU  - Stanton, Brian
AU  - Hofmann, Patrick
PY  - 2009
PB  - National Institute of Standards and Technology
CY  - Gaithersburg, MD
SN  - NIST IR 7645
DO  - 10.6028/NIST.IR.7645
ER  -