TY  - RPRT
TI  - Operational measures and accuracies of ROC curve on large fingerprint data sets 
AU  - Wu, Jin Chu
PY  - 2008
PB  - National Institute of Standards and Technology
CY  - Gaithersburg, MD
SN  - NIST IR 7495
DO  - 10.6028/NIST.IR.7495
ER  -