TY  - RPRT
TI  - Distributed testing of a device-level interface specification for a metrology system 
AU  - Horst, John
AU  - Kramer, Thomas
AU  - Stouffer, Keith
AU  - Falco, Joseph
AU  - Huang, Hui-Min
AU  - Proctor, Frederick
AU  - Wavering, Albert
PY  - 2002
PB  - National Institute of Standards and Technology
CY  - Gaithersburg, MD
SN  - NIST IR 6851
DO  - 10.6028/NIST.IR.6851
ER  -