TY  - RPRT
TI  - Information models for design tolerancing: from conceptual to the detail design
AU  - Sudarsan, R
AU  - Roy, U
AU  - Narahari, Y
AU  - Sriram, RD
AU  - Lyons, K W
AU  - Pramanik, N
PY  - 2000
PB  - National Institute of Standards and Technology
CY  - Gaithersburg, MD
SN  - NIST IR 6524
DO  - 10.6028/NIST.IR.6524
ER  -