TY  - RPRT
TI  - An analysis of existing ontological systems for applications in manufacturing and healthcare 
AU  - Schlenoff, Craig
AU  - Denno, Peter
AU  - Libes, Don
AU  - Szykman, Simon
AU  - Ivester, Robert
PY  - 1999
PB  - National Institute of Standards and Technology
CY  - Gaithersburg, MD
SN  - NIST IR 6301
DO  - 10.6028/NIST.IR.6301
ER  -