TY  - RPRT
TI  - Optical pattern recognition with microlasers 
AU  - Paek, Eung Gi
PY  - 1998
PB  - National Institute of Standards and Technology
CY  - Gaithersburg, MD
SN  - NIST IR 6017
DO  - 10.6028/NIST.IR.6017
ER  -