TY  - RPRT
TI  - Summary report: second workshop on industrial applications of scanned probe microscopy, May 2-3, 1995
AU  - Dagata, J A
AU  - Diebold, A C
AU  - Shih, C K
AU  - Colton, R J
PY  - 1995
PB  - National Institute of Standards and Technology
CY  - Gaithersburg, MD
SN  - NIST IR 5752
DO  - 10.6028/NIST.IR.5752
ER  -