TY  - RPRT
TI  - HgCdTe detector reliability study for the GOES Program 
AU  - Seiler, David G
AU  - Harman, George G
AU  - Lowney, Jeremiah R
AU  - Mayo, Santos
AU  - Liggett, Walter S Jr
PY  - 1991
PB  - National Institute of Standards and Technology
CY  - Gaithersburg, MD
SN  - NIST IR 4687
DO  - 10.6028/NIST.IR.4687
ER  -