TY  - RPRT
TI  - MIS capacitor studies on silicon carbide single crystals: final report for May 8, 1989 to November 8, 1989
AU  - Kopanski, J J
PY  - 1990
PB  - National Institute of Standards and Technology
CY  - Gaithersburg, MD
SN  - NIST IR 4352
DO  - 10.6028/NIST.IR.4352
ER  -