TY  - RPRT
TI  - A technique for measuring the surface temperature of transistors by means of fluorescent phosphor 
AU  - Brenner, David J
PY  - 1971
PB  - National Bureau of Standards
CY  - Gaithersburg, MD
SN  - NBS TN 591
DO  - 10.6028/NBS.TN.591
ER  -