TY  - RPRT
TI  - Determination of deep impurities in Silicon and Germanium by infrared photoconductivity 
AU  - Thurber, W Robert
PY  - 1971
PB  - National Bureau of Standards
CY  - Gaithersburg, MD
SN  - NBS TN 570
DO  - 10.6028/NBS.TN.570
ER  -