TY  - RPRT
TI  - Methods of measurement for semiconductor materials, process control, and devices : quarterly report January 1 to March 30, 1970
AU  - Baroody Jr., A J
AU  - Bullis, W Murray
PY  - 1970
PB  - National Bureau of Standards
CY  - Gaithersburg, MD
SN  - NBS TN 555
DO  - 10.6028/NBS.TN.555
ER  -