TY  - RPRT
TI  - Methods of measurement for semiconductor materials, process control, and devices : quarterly report, July 1 to September 30, 1969
AU  - Bullis, W Murray
PY  - 1970
PB  - National Bureau of Standards
CY  - Gaithersburg, MD
SN  - NBS TN 520
DO  - 10.6028/NBS.TN.520
ER  -