TY  - RPRT
TI  - Methods of measurement for semiconductor materials, process control, and devices, quarterly report, October 1 to December 31, 1968. 
AU  - Bullis, W Murray
PY  - 1969
PB  - National Bureau of Standards
CY  - Gaithersburg, MD
SN  - NBS TN 475
DO  - 10.6028/NBS.TN.475
ER  -