TY  - RPRT
TI  - Measurement of carrier lifetime in semiconductors: an annotated bibliography covering the period 1949-1967
AU  - Bullis, W Murray
PY  - 1968
PB  - National Bureau of Standards
CY  - Gaithersburg, MD
SN  - NBS TN 465
DO  - 10.6028/NBS.TN.465
ER  -