TY  - RPRT
TI  - A bibliography on methods for the measurement of inhomogeneities in semiconductors, 1953-1967 
AU  - Schafft, Harry A
PY  - 1968
PB  - National Bureau of Standards
CY  - Gaithersburg, MD
SN  - NBS TN 445
DO  - 10.6028/NBS.TN.445
ER  -