TY  - RPRT
TI  - Calculations for comparing two-point and four-point probe resistivity measurements on rectangular bar-shaped semiconductor samples. 
AU  - Swartzendruber, Lydon J
PY  - 1964
PB  - National Bureau of Standards
CY  - Gaithersburg, MD
SN  - NBS TN 241
DO  - 10.6028/NBS.TN.241
ER  -