TY  - RPRT
TI  - Nondestructive tests used to insure the integrity of semiconductor devices, with emphasis on acousticemission techniques 
AU  - Harman, George G
PY  - 1979
PB  - National Bureau of Standards
CY  - Gaithersburg, MD
SN  - NBS SP 400-59
DO  - 10.6028/NBS.SP.400-59
ER  -