TY  - RPRT
TI  - The dopant density and temperature dependence of electron mobility and resistivity in N-type silicon 
AU  - Li, Sheng S
PY  - 1977
PB  - National Bureau of Standards
CY  - Gaithersburg, MD
SN  - NBS SP 400-33
DO  - 10.6028/NBS.SP.400-33
ER  -