TY  - RPRT
TI  - Microelectronic test pattern NBS-4 
AU  - Thurber, W Robert
AU  - Buehler, Martin G
PY  - 1978
PB  - National Bureau of Standards
CY  - Gaithersburg, MD
SN  - NBS SP 400-32
DO  - 10.6028/NBS.SP.400-32
ER  -