TY - RPRT TI - Defects in PN junctions and MOS capacitors observed using thermally stimulated current and capacitance measurements-videotape script AU - Buehler, Martin G PY - 1976 PB - National Bureau of Standards CY - Gaithersburg, MD SN - NBS SP 400-26 DO - 10.6028/NBS.SP.400-26 ER -