TY  - RPRT
TI  - Improved infrared response technique for detecting defects and impurities in germanium and silicon d-i-n diodes 
AU  - Sher, A H
PY  - 1975
PB  - National Bureau of Standards
CY  - Gaithersburg, MD
SN  - NBS SP 400-13
DO  - 10.6028/NBS.SP.400-13
ER  -