TY  - RPRT
TI  - Ellipsometry in the measurement of surfaces and thin films : symposium proceedings Washington 1963/
AU  - Stromberg, R R
AU  - Passaglia, E
PY  - 1964
PB  - National Institute of Standards and Technology
CY  - Gaithersburg, MD
SN  - NBS MP 256
DO  - 10.6028/NBS.MP.256
ER  -