TY  - RPRT
TI  - Measurement techniques for high-power semiconductor materials and devices : annual report, January 1, 1982 to March 31, 1983
AU  - Thurber, W R
AU  - Lowney, J R
AU  - Phillips, W E
PY  - 1984
PB  - National Bureau of Standards
CY  - Gaithersburg, MD
SN  - NBS IR 84-2838
DO  - 10.6028/NBS.IR.84-2838
ER  -