TY  - RPRT
TI  - Measurement techniques for high-resistivity detector-grade silicon : progress report, July 1, 1982 to June 30, 1983
AU  - Larrabee, R D
PY  - 1983
PB  - National Bureau of Standards
CY  - Gaithersburg, MD
SN  - NBS IR 83-2792
DO  - 10.6028/NBS.IR.83-2792
ER  -