TY  - RPRT
TI  - 1981 annual report : optical measurements for interfacial conduction and breakdown
AU  - Hebner, R E
AU  - Kelley, E F
AU  - Hagler, J N
PY  - 1983
PB  - National Bureau of Standards
CY  - Gaithersburg, MD
SN  - NBS IR 82-2629
DO  - 10.6028/NBS.IR.82-2629
ER  -