TY  - RPRT
TI  - Measurement techniques for high power semiconductor materials and devices : annual report, October 1, 1980 to December 31, 1981
AU  - Thurber, W R
AU  - Phillips, W E
AU  - Larrabee, R D
PY  - 1982
PB  - National Bureau of Standards
CY  - Gaithersburg, MD
SN  - NBS IR 82-2552
DO  - 10.6028/NBS.IR.82-2552
ER  -