TY  - RPRT
TI  - Measurement techniques for high power semiconductor materials and devices : annual report, October 1, 1979 to September 30, 1980
AU  - Larrabee, R C
AU  - Phillips, W E
AU  - Thurber, W R
PY  - 1981
PB  - National Bureau of Standards
CY  - Gaithersburg, MD
SN  - NBS IR 81-2325
DO  - 10.6028/NBS.IR.81-2325
ER  -