TY  - RPRT
TI  - 1980 annual report : optical measurements for interfacial conduction and breakdown
AU  - Hebner, R E
AU  - Kelley, E F
AU  - Thompson, J E
AU  - Sudarshan, T, S
AU  - Jones, T B
PY  - 1981
PB  - National Bureau of Standards
CY  - Gaithersburg, MD
SN  - NBS IR 81-2275
DO  - 10.6028/NBS.IR.81-2275
ER  -