TY  - RPRT
TI  - Microelectronic test patterns NBS-12 and NBS-24 
AU  - Carver, G P
AU  - Mattis, R L
AU  - Buehler, M G
PY  - 1981
PB  - National Bureau of Standards
CY  - Gaithersburg, MD
SN  - NBS IR 81-2234
DO  - 10.6028/NBS.IR.81-2234
ER  -