TY  - RPRT
TI  - Measurement techniques for high power semiconductor materials and devices : annual report, October 1, 1978 to September 30, 1979
AU  - Oettinger, F F
AU  - Larrabee, R D
PY  - 1980
PB  - National Bureau of Standards
CY  - Gaithersburg, MD
SN  - NBS IR 80-2061
DO  - 10.6028/NBS.IR.80-2061
ER  -